ELp740
| ELp740 | |
|---|---|
| On-wafer Device Characterization Laboratory | |
| Credits | 3 |
| Structure | 0-0-6 |
| Pre-requisites | Any one of :ELL732/ELL740/ELL211/ELL231/ |
| Overlaps | |
ELp740 : On-wafer Device Characterization Laboratory
[edit]CRL621/CRL722/CRL621/PYL306/PYL653/PYL702/MLL738 Semiconductor parameter analyzer and SCPI, Measurements of on- wafer test structures using wafer prober, Measurements of packaged (SMT) devices using packaged IC tester, p-n junction diode DC IV & CV characterization at room temperature and model parameter extraction, p-n junction diode DC IV & CV characterization at higher temperatures, MOS capacitor CV characterization at room temperature, MOSFET DC ld-Vg and ld-Vd characterization at room temperature, MOSFET DC characterization using Cryogenic Probe Station, RF characterization using 2-port S-parameters, MOSF.ET RF characterization at room temperature, MOSFET large-signal RF characterization using load-pull method, MOSFET Flicker noise characterization at room temperature, Lab project.