PYL751
| pYL751 | |
|---|---|
| Optical sources, photometry and metrology | |
| Credits | 3 |
| Structure | 3-0-0 |
| Pre-requisites | |
| Overlaps | |
pYL751 : Optical sources, photometry and metrology
[edit]Eye and vision: Visual system, Sensitivity, Acuity; Radiometry and Photometry: Radiometric quantities and their measurements, Photometric quantities, Radiation from a surface; Brightness and luminous intensity distribution; Integrating sphere; Illumination from a line, Surface and volume sources; Colorimetry: Fundamentals, Trichromatic specifications, Colorimeters, CIE system; Conventional light sources: Point and extended sources; Incandescent, fluorescent, discharge lamps; LEDs; Lighting fundamentals, Optical detectors; Detector characteristics, Noise considerations, Single & multi-element detectors, CCDs. Optical metrology: Surface inspection, Optical gauging and profiling, Techniques for non-destructive testing, Moire self imaging and Speckle metrology, Sensing elements.