PYL323: Difference between revisions
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| credits = 2 | | credits = 2 | ||
| credit_structure = 2-0-0 | | credit_structure = 2-0-0 | ||
| pre_requisites = PYL125 | | pre_requisites = [[PYL125]] | ||
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Latest revision as of 16:43, 14 April 2026
| pYL323 | |
|---|---|
| Nanoscale Microscopy | |
| Credits | 2 |
| Structure | 2-0-0 |
| Pre-requisites | PYL125 |
| Overlaps | |
pYL323 : Nanoscale Microscopy
Scanning probe microscopy such as scanning electron microscope, atomic force microscope, scanning electron micoscope. Transmission electron microscope with high resolution and near field optical microscopy.