https://wiki.devclub.in/index.php?action=history&feed=atom&title=ELp740 2026-04-09T06:03:09Z Revision history for this page on the wiki MediaWiki 1.45.1 https://wiki.devclub.in/index.php?title=ELp740&diff=839&oldid=prev 2026-03-04T10:03:35Z

<p>Creating course page via bot</p> <p><b>New page</b></p><div>{{Infobox Course<br /> | code = ELp740<br /> | name = On-wafer Device Characterization Laboratory<br /> | credits = 3<br /> | credit_structure = 0-0-6<br /> | pre_requisites = Any one of :ELL732/ELL740/ELL211/ELL231/<br /> | overlaps = <br /> }}<br /> <br /> == ELp740 : On-wafer Device Characterization Laboratory ==<br /> CRL621/CRL722/CRL621/PYL306/PYL653/PYL702/MLL738 Semiconductor parameter analyzer and SCPI, Measurements of on- wafer test structures using wafer prober, Measurements of packaged (SMT) devices using packaged IC tester, p-n junction diode DC IV &amp; CV characterization at room temperature and model parameter extraction, p-n junction diode DC IV &amp; CV characterization at higher temperatures, MOS capacitor CV characterization at room temperature, MOSFET DC ld-Vg and ld-Vd characterization at room temperature, MOSFET DC characterization using Cryogenic Probe Station, RF characterization using 2-port S-parameters, MOSF.ET RF characterization at room temperature, MOSFET large-signal RF characterization using load-pull method, MOSFET Flicker noise characterization at room temperature, Lab project.</div>

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